Scanning Electron Microscope (SEM)

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Given sufficient light, the human eye can distinguish two points 0.2 mm apart. Imagine being able to distinguish 3.5nm to 50nm (sample dependent). Magnification: 15 to 100,000x.

HOW IT CAN HELP

  • Measure topographical features using secondary electron imaging
  • Determine phase separation of metals and ceramics
  • Image non-conductive materials without coating
  • Determine elemental separation in non-homogeneous samples (EDS)
  • Find weight and atomic percent composition down to 1% accuracy (EDS)

DETAILED DESCRIPTION

Specifications: 

  • Accommodates specimens up to 70mm diameter and 50mm thick
  • 17.5mm X/Y specimen movement
  • Approximately 1 minute pump-down time
  • Magnifications up to 30,000x sample dependent
  • Low-vacuum, charge-up reduction mode to decrease need to sputter samples
  • 5 and 15 kV accelerating voltages
  • SE, BSE and EDS modes possible
  • ThermoFisher Pathfinder Basecamp EDS detector

HOW MUCH DOES IT COST?

Typically $41 per hour plus assistance if needed. 

WHAT CAN I EXPECT?

The unit is located at MCE 1325 (110 Central Campus Dr, Salt Lake City, UT 84112). Schedule a time to use the equipment with the MCE Dept and request assistance if required.

HOW TO GET STARTED

Review training and contact rates at: https://mcl.mse.utah.edu/equipment/hitachi-tm3030plus/

CLICK HERE FOR MORE INFORMATION
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